Sugano M., Scheuerlein C., Bordini B., Ballarino A., Alknes P., Bjoerstad R., Hudspeth J., Hagner M.
Bottura L., Sugano M., Scheuerlein C., Rikel M.O., Ballarino A., Bjoerstad R., Hudspeth J., Grether A.
Ключевые слова: HTS, YBCO, YGdBCO, coated conductors, DI-Bi2223, tapes, Bi2212, wires round, mechanical properties, stress effects, strain effects, transverse stress, X-ray diffraction, critical caracteristics, critical current, degradation studies, n-value, lattice parameter, experimental results, electromechanical analysis
Bottura L., Sugano M., Scheuerlein C., Ballarino A., Rikel M., Bjoerstad R., Hudspeth J., Grether A.
Ключевые слова: presentation, LTS, Nb3Sn, mechanical properties, synchrotron, X-ray diffraction, texture, stress effects, strain effects, lattice parameter, compression, measurement setup, tensile tests, HTS, Bi-based systems, REBCO, Bi2212, n-value, critical caracteristics, critical current, degradation studies, MgB2, Bi2223, transverse stress, elastic behavior
Ключевые слова: MgB2, LHC, luminosity, cables, links, filaments, elastic behavior, tensile tests, barriers, experimental results, stress effects, strain effects, mechanical properties
Bottura L., Sugano M., Scheuerlein C., Rikel M.O., Jiang J., Michiel M.D., Ballarino A., Matras M., Bjoerstad R., Hudspeth J.
Ключевые слова: HTS, Bi2212, wires round, densification, mechanical properties, strain effects, degradation studies, critical caracteristics, critical current, overpressure processing, strain effects, X-ray diffraction, measurement setup, n-value, lattice parameter, temperature dependence, thermal expansion
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